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DOE OSTI · 2563907

Temperature Dependent Electron Emission in Focused Ion Beam Microscopes

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Hodges, Wyatt Lea, Deitz, Julia Irene, Jauregui, Luis Jose, Perry, Daniel Lee, Boro, Joseph Robert, Duree, Jessica Marie. 2024-04-01. Temperature Dependent Electron Emission in Focused Ion Beam Microscopes. https://doi.org/10.2172/2563907

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