DOE OSTI · 2563040
In-device Battery Failure Analysis
Abstract
Lithium-ion batteries are indispensable power sources for a wide range of modern electronic devices. However, battery lifespan remains a critical limitation, directly affecting the sustainability and user experience. Conventional battery failure analysis in controlled lab settings may not capture the complex interactions and environmental factors encountered in real-world, in-device operating conditions. Here, this study analyzes the failure of commercial wireless earbud batteries as a model system within their intended usage context. Through multiscale and multimodal characterizations, the degradations from the material level to the device level are correlated, elucidating a failure pattern that is closely tied to the specific device configuration and operating conditions. The findings indicate that the ultimate failure mode is determined by the interplay of battery materials, cell structural design, and the in-device microenvironment, such as temperature gradients and their fluctuations. This holistic, in-device perspective on environmental influences provides critical insights for battery integration design, enhancing the reliability of modern electronics.
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Qian, Guannan [University of Texas, Austin, TX (United States)], Zan, Guibin [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL); Sigray Inc., Concord, CA (United States)], Li, Jizhou [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Meng, Dechao [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Sun, Tianxiao [University of Texas, Austin, TX (United States)], Thampy, Vivek [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Yanyachi, Ayrton M. [University of Texas, Austin, TX (United States)], Huang, Xiaojing [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source (NSLS)], Yan, Hanfei [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source (NSLS)], Chu, Yong S. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source (NSLS)], Gul, Sheraz [Sigray Inc., Concord, CA (United States)], Huang, Juanjuan [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)], Kelly, Shelly D. [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)], Lee, Sang‐Jun [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Lee, Jun‐Sik [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Yun, Wenbing [Sigray Inc., Concord, CA (United States)], Cloetens, Peter [European Synchrotron Radiation Facility (ESRF), Grenoble (France)], Pianetta, Piero [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)], Zhao, Kejie [Purdue University, West Lafayette, IN (United States)], Ezekoye, Ofodike A. [University of Texas, Austin, TX (United States)], Liu, Yijin [University of Texas, Austin, TX (United States)] (ORCID:0000000284172488). 2025-01-31. In-device Battery Failure Analysis. https://doi.org/10.1002/adma.202416915
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