Thick-shell model of indirect-drive yield sensitivity

Landen, O. L. (ORCID:0000000214998217); Baker, K. L.; Casey, D. T.; Divol, L.; Haan, S. W.; Ho, D.; Hurricane, O. A.; Kritcher, A. L.; Lindl, J. D.; MacLaren, S. A.; Nora, R. C.; Pak, A.; Ralph, J.; Smalyuk, V.; Tommasini, R.; Weber, C.

doi:10.1016/j.hedp.2024.101101

DOE OSTI · 2438381

Thick-shell model of indirect-drive yield sensitivity

Landen, O. L. (ORCID:0000000214998217)·Baker, K. L.·Casey, D. T.·Divol, L.·Haan, S. W.·Ho, D.·Hurricane, O. A.·Kritcher, A. L.·Lindl, J. D.·MacLaren, S. A.·Nora, R. C.·Pak, A.·Ralph, J.·Smalyuk, V.·Tommasini, R.·Weber, C.

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Landen, O. L. (ORCID:0000000214998217), Baker, K. L., Casey, D. T., Divol, L., Haan, S. W., Ho, D., Hurricane, O. A., Kritcher, A. L., Lindl, J. D., MacLaren, S. A., Nora, R. C., Pak, A., Ralph, J., Smalyuk, V., Tommasini, R., Weber, C.. 2024-09-01. Thick-shell model of indirect-drive yield sensitivity. https://doi.org/10.1016/j.hedp.2024.101101

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