Engineering Papers⌕ Search

DOE OSTI · 2430205

Predicting Failure Using Deep Learning SAND Report

Abstract

Accurate prediction of ductile failure is critical to Sandia’s NW mission, but the models are computationally heavy. The costs of including high-fidelity physics and mechanics that are germane to the failure mechanisms are often too burdensome for analysts either because of the person-hours it requires to input them or because of the additional computational time, or both. In an effort to deliver analysts a tool for representing these phenomena with minimal impact to their existing workflow, our project sought to develop modern data-driven methods that would add microstructural information to business-as-usual calculations and expedite failure predictions. The goal is a tool that receives as input a structural model with stress and strain fields, as well as a machine-learned model, and output predictions of structural response in time, including failure. As such, our project spent substantial time performing high-fidelity, three-dimensional experiments to elucidate materials mechanisms of void nucleation and evolution. We developed crystal-plasticity finite-element models from the experimental observations to enrich the findings with fields not readily measured. We developed engineering length-scale simulations of replicated test specimens to understand how the engineering fields evolve in the presence of fine-scale defects. Finally, we developed deep learning convolutional neural networks, and graph-based neural networks to encode the findings of the experiments and simulations and make forward predictions in time for structural performance. This project demonstrated the power of data-driven methods for model development, which have the potential to vastly increase both the accuracy and speed of failure predictions. These benefits and the methods necessary to develop them are highlighted in this report. However, many challenges remain to implementing these in real applications, and these are discussed along with potential methods for overcoming them.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Johnson, Kyle Leslie, Noell, Philip James, Lim, Hojun, Buarque de Macedo, Robert, Maestas, Demitri, Polonsky, Andrew T., Emery, John Matthew, Pant, Aniket, Vaughan, Matthew W., Martinez, Carianne, Potter, Kevin Matthew, Solano, Javi, Sangid, Michael David. 2023-09-21. Predicting Failure Using Deep Learning SAND Report. https://doi.org/10.2172/2430205

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗