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DOE OSTI · 2338308

Electron Density Measurements Using USPR (Final Scientific/Technical Report)

Abstract

UC Davis has fabricated an ultrashort pulse reflectometer (USPR) diagnostic instrument for electron density profile measurements on compact, short duration, magnetically-confined fusion-energy concept devices such as spheromaks and FRCs. The USPR system transmits extremely short duration (~few nsec) chirped waveforms that together span 29 to 75 GHz. These chirped waveforms illuminate and reflect from the target plasma, with each frequency component reflecting from a different density layer (higher frequencies probe deeper into the plasma before reflecting). The reflected waveforms are split into roughly 42 different frequencies; time-of-flight (TOF) measurements made at each frequency with high resolution (~25 psec measurement resolution which corresponds to ~5 mm). These TOF data may then be inverted via software to generate electron density profiles with high time resolution (~10 μsec). At the heart of the system is a field programmable gate array (FPGA) based controller which collects and processes all of the USPR data in addition to generating all of the control signals required for maximum flexibility. The FPGA controller has the software flexibility to be easily reconfigured for different plasma devices, and the entire system sufficiently compact to be easily and quickly transported between devices. A high speed impulse generator was transformed into a set of three ultrashort pulse transmitter chirps using a combination of dispersive waveguide, frequency doublers and high-pass filters. A mm-wave controller was fabricated to sequentially switch between the three chirps, directing the chirps one-by-one to three different mm-wave assemblies spanning 29-75 GHz. Each mm-wave assembly consists of a high power active multiplier chain which converts the transmitter chirp to higher frequencies, and a broadband mixer which downconverts the reflected waveform to the 2-18 GHz range of the UPSR receiver. The 16-channel receiver (shared by all 3 mm-wave assemblies) was fabricated employing custom TOF modules capable of operating at a high 1 MHz sampling rate. Laboratory testing of the full system revealed the presence of unwanted harmonics from the multiplication process, with interference observed in the downconverted reflections at selected frequency channels that could not be completely filtered out. Additional interference effects arising from internal reflections within the mm-wave assemblies were minimized using a high-speed switch which served to “gate out” much of these reflections. The USPR diagnostic was transported and installed onto the HIT-SIU plasma device, becoming operational on 11/08/2022. Although designed to span 3 distinct mm-wave bands, the HIT-SIU plasmas at this time were sufficiently low density such that only the lowest of the three bands was likely to have strong plasma reflections. The system was then set to operate on only the lowest band (assembly #1), with data collected every 1 μsec rather than 3 μsec which would have been the case when cycling through all three bands. Connected to HIT-SIU, time-varying plasma reflections were observed on 9 of 16 possible frequency channels. Close examination of the data collected revealed issues previously unobserved in laboratory testing, associated with (a) reflections from the small aperture horns required for operation within the HIT-SIU device, and (b) a dependence of the recorded TOF with the threshold voltage of a given channel. Plans were made to address each of these issues before undertaking any future campaigns.

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BibTeXRIS

Luhmann, Jr., Neville, Domier, Calvin. 2024-01-17. Electron Density Measurements Using USPR (Final Scientific/Technical Report). https://doi.org/10.2172/2338308

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