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DOE OSTI · 1986928

GaN-based threshold switching device and memory diode

Abstract

A switching device including a GaN substrate; an unintentionally doped GaN layer on a first surface of the GaN substrate; a regrown unintentionally doped GaN layer on the unintentionally doped GaN layer; a regrowth interface between the unintentionally doped GaN layer and the regrown unintentionally doped GaN layer; a p-GaN layer on the regrown unintentionally doped GaN layer; a first electrode on the p-GaN layer; and a second electrode on a second surface of the GaN substrate.

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Fu, Kai, Fu, Houqiang, Zhao, Yuji. 2022-12-13. GaN-based threshold switching device and memory diode. https://www.osti.gov/biblio/1986928

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