X-Ray Scattering Data Processing and Analysis

Abstract

Semicrystalline polymers have a degree of crystallinity that depends on chain structure and crystallization conditions. Thermomechanical properties are influenced by the degree of crystallinity and crystalline morphology. A common method used to understand crystalline content, crystal and amorphous layer thickness, and layer thickness distributions, is X-ray scattering (XS). This report uses XS to first investigate crystalline orientation in high density polyethylene (HDPE) samples. Then, a single orientation is analyzed via XS in a temperature study to investigate crystalline behavior under changing temperatures. Lastly, block copolymer filaments extruded at varying speeds are analyzed. The X-ray data are used to gain a baseline understanding of crystalline behavior in these unique filaments.