Using Long Range Optical Techniques to Predict Vertical GaN Diode Performance.

Gallagher, J. C.; Ebrish, Mona A.; Jacobs, A. G.; Koehler, A. D.; Gunning, Brendan; Kaplar, Robert; Hobart, K. D.; Anderson, T. J.

doi:10.2172/1878453

DOE OSTI · 1878453

Using Long Range Optical Techniques to Predict Vertical GaN Diode Performance.

Gallagher, J. C.·Ebrish, Mona A.·Jacobs, A. G.·Koehler, A. D.·Gunning, Brendan·Kaplar, Robert·Hobart, K. D.·Anderson, T. J.

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Gallagher, J. C., Ebrish, Mona A., Jacobs, A. G., Koehler, A. D., Gunning, Brendan, Kaplar, Robert, Hobart, K. D., Anderson, T. J.. 2021-07-01. Using Long Range Optical Techniques to Predict Vertical GaN Diode Performance.. https://doi.org/10.2172/1878453

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