Truncated nonlinear interferometer-based atomic force microscopes

Abstract

A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.