DOE OSTI · 1769250
A self-driving microscope and the Atomic Forge
Abstract
The electron microscope predates the transistor and the charge-coupled device (CCD). The opportunity to integrate these advancements into the electron microscope was seized and revolutionized in the modern (scanning) transmission electron microscope (STEM). Real-time analysis became possible and is now routine. Consider the efforts one would have to undertake to perform a Fourier transform in the days when images were acquired by exposing photographic plates. Indeed, it was real-time data analysis that enabled the measurement and correction of aberrations in modern instrumentation.1 What are the next opportunities on the horizon for the STEM?
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Dyck, Ondrej, Jesse, Stephen, Kalinin, Sergei V.. 2019-09-27. A self-driving microscope and the Atomic Forge. https://doi.org/10.1557/mrs.2019.211
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