DOE OSTI · 1202263
Materials Data on SiBi2O5 by Materials Project
Abstract
Bi2SiO5 crystallizes in the orthorhombic Cmc2_1 space group. The structure is three-dimensional. Si4+ is bonded to four O2- atoms to form corner-sharing SiO4 tetrahedra. There are a spread of Si–O bond distances ranging from 1.63–1.69 Å. Bi3+ is bonded in a 6-coordinate geometry to six O2- atoms. There are a spread of Bi–O bond distances ranging from 2.20–2.53 Å. There are three inequivalent O2- sites. In the first O2- site, O2- is bonded to four equivalent Bi3+ atoms to form a mixture of distorted corner and edge-sharing OBi4 tetrahedra. In the second O2- site, O2- is bonded in a distorted single-bond geometry to one Si4+ and two equivalent Bi3+ atoms. In the third O2- site, O2- is bonded in a linear geometry to two equivalent Si4+ atoms.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
2020-07-14. Materials Data on SiBi2O5 by Materials Project. https://doi.org/10.17188/1202263
Cite the original work for its findings. Save a collection to share your selection of sources.