DOE OSTI · 1106747
Progress in SiC MOSFET Reliability.
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Hughart, David Russell, Flicker, Jack David, Kaplar, Robert, DasGupta, Sandeepan, Atcitty, Stanley, Marinella, Matthew. 2013-07-01. Progress in SiC MOSFET Reliability.. https://doi.org/10.1149/05804.0211ecst
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