Solid Collection Efforts: Ta Collimator Evaluation

Abstract

Ta collimator sets that were part of the gated x-ray detector diagnostic (GXD) at NIF were analyzed for debris distribution and damage in 2011. These disks (ranging in thickness from 250 to 750 {mu}m) were fielded approximately 10 cm from target chamber center (TCC) on various symcap, THD and re-emit shots. The nose cone holder and forward Ta collimator (facing target chamber center, TCC) from all shots show evidence of surface melt. Non-destructive analysis techniques such as optical microscopy, surface profilometry, scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), and x-ray fluorescence (XRF) were used to determine debris composition and degree of deformation associated with each Ta disk. Molten debris from the stainless steel nose cone contaminated the surface of the collimators along with other debris associated with the target assembly (Al, Si, Cu, Au and In). Surface elemental analysis of the forward collimator Ta disks indicates that Au hohlraum debris is less concentrated on these samples versus those fielded 50 cm from TCC in the wedge range filter (WRF) assembly. It is possible that the Au is distributed below or within the stainless steel melt layer covering the disk, as most of the foreign debris is captured in the melted coating. The other disks (fielded directly behind the forward collimator in a sandwiched configuration) have visible forms of deformation and warping. The degree of warping increases as the shock wave penetrates the assembly with the most damage sustained on the back collimator. In terms of developing a solid collection capability, the collimator analyses suggests that close proximity may cause more interference with capsule debris collection and more damage to the surface of the collector diagnostic. The analyses of the Ta collimators were presented to the Target and Laser Interaction Sphere (TaLIS) group; a representative presentation is attached to this document.