NASA NTRS · 20210002040
UNKNOWN
Explore connections, maps & timelines
Dutta, K., Ames, L., Beregovski, Y., Sigrist, N., Kuan, G., Diaz, R., Zhao, F.. 2002-08-22. SIM internal metrology beam launcher development. https://ntrs.nasa.gov/citations/20210002040
Cite the original work for its findings. Save a collection to share your selection of sources.
KEEP EXPLORING
A system combining an interferometer with an environmental chamber for measuring both coefficient of thermal expansion (CTE) and temperature-dependent refractive index (dn/dT) simultaneously is presented. The operation and measurement results of this instrument are discussed.
The Space Interferometry Mission (SIM) is a microarcsecond interferometric space telescope that requires picometer level precision measurements of its truss and interferometer baselines. Single-gauge metrology errors due to non-ideal physical characteristics of corner cubes reduce the angular measurement capability of the science instrument. Specifically, the non-common vertex error (NCVE) of a shared vertex, double corner cube introduces micrometer level single-gauge errors in addition to errors due to dihedral angles and reflection phase shifts. A modified SIM Kite Testbed containing an articulating double corner cube is modeled and the results are compared to the experimental testbed data. The results confirm modeling capability and viability of calibration techniques.