NASA NTRS · 20170004498
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Champey, Patrick, Savage, Sabrina. 2017-05-05. MSFC Solar Instrumentation Group. https://ntrs.nasa.gov/citations/20170004498
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The scientific demand for extended field X-Ray remote sensing for mapping of planetary bodies has produced the CubeSat X-ray Telescope (CubeX) lunar mission concept. Orbiting the Moon at 6,000 km for 1 year sometime during the mid-decade solar maximum, the primary objectives of CubeX are to map lunar surface elemental abundances and to assess feasibility of x-ray pulsar timing navigation. CubeX’s Miniature X-ray Optics (MiXO) design builds on heritage of existing X-ray imaging designs using new electroformed NiCo alloy replication (ENR) to create shells of 1 mm thickness. MiXO will provide 1 arcmin resolution X-Ray imaging for an extended instantaneous field of view, at various energy range sensitivities. Based on the classic Wolter-Type I design (using a paraboloid/hyperboloid grazing mirror pair), mirror parameters were expanded to allow both shell length and focal-plane offsets to vary independently. The design was optimized with a merit function that factored together four sub-merits: PSF sharpness (measured as half-power diameter), consistency across the field, minimized scattering, and maximized effective area. Monte Carlo analysis was used to predict final performance, including surface scatter effects. The demonstrated configurations include a compact 34 shell design with a diameter of 105 mm more efficient at higher energies, and a larger 130 mm/24 shell version with a larger overall effective area at lower energies. The compact design carries more expensive fabrication and assembly cost (with more shells) as well as a more challenging alignment (with denser packing). Both have overall resolution <1’ up to 26’ off-axis and <1.5’ up to 33’ off-axis, whereas a conventional design’s image quality degrades quickly beyond 15’ off-axis. This opens up new possibilities for future SmallSat missions that could use two different configurations for wide energy ranges or midsized instruments using multiple identical modules for larger collecting area.
A thermal oxide patterning method has proven to be effective for correcting coating-stress-induced distortion on flat silicon wafers. We report progress on developing this method for correcting curved silicon mirrors distorted by front-side iridium coatings. Owing to the difference in geometry, a finite element model has been established to calculate the appropriate duty cycle maps in thermal oxide hexagon patterns used for compensation. In addition, a photolithographic process, along with three-dimensional printed equipment, has been developed for creating patterns precisely on the back side of curved mirrors. The developed method has been used to recover the original surface shape of two silicon mirrors which are 100-mm long, 0.5-mm thick, having 312-mm radius of curvature, and 30 deg in azimuthal span (Wolter-I geometry). These mirrors’ front sides are sputter-coated by 20-nm iridium layers with ∼-70 N∕m integrated stress. Measurement results show that the developed method can mitigate coating-induced distortion by a factor of ∼5 in RMS height and ∼4 in RMS slope error, corresponding to ∼0.5 arc sec RMS slope error. Residual errors after correction are dominated by midfrequency ripples created during the annealing process, which will be resolved in the future. The presented method is precise and inexpensive and a potential candidate for resolving the coating stress issue for Lynx optics in the future.