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NASA NTRS · 20110024023

Techniques for Characterizing Microwave Printed Antennas

Abstract

The combination of a de-embedding technique and a direct on-substrate measurement technique has been devised to enable measurement of the electrical characteristics (impedances, scattering parameters, and gains) of microwave printed antennas that may be formed integrally with feed networks that include slot lines, coplanar striplines, and/or coplanar waveguides. The combination of techniques eliminates the need for custom test fixtures, including transitions between (1) coaxial or waveguide feed lines in typical test equipment and (2) the planar waveguide structures of the printed circuits under test. The combination of techniques can be expected to be especially useful for rapid, inexpensive, and accurate characterization of antennas for miniature wireless communication units that operate at frequencies from a few to tens of gigahertz.

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BibTeXRIS

Simons, Rainee, Lee, Richard Q.. 2003-12-01. Techniques for Characterizing Microwave Printed Antennas. https://ntrs.nasa.gov/citations/20110024023

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