Vacuum Attachment for XRF Scanner

Abstract

Vacuum apparatuses have been developed for increasing the range of elements that can be identified by use of x-ray fluorescent (XRF) scanners of the type mentioned in the two immediately preceding articles. As a consequence of the underlying physical principles, in the presence of air, such an XRF scanner is limited to analysis of chlorine and elements of greater atomic number. When the XRF scanner is operated in a vacuum, it extends the range of analysis to lower atomic numbers - even as far as aluminum and sodium. Hence, more elements will be available for use in XRF labeling of objects as discussed in the two preceding articles. The added benefits of the extended capabilities also have other uses for NASA. Detection of elements of low atomic number is of high interest to the aerospace community. High-strength aluminum alloys will be easily analyzed for composition. Silicon, a major contaminant in certain processes, will be detectable before the process is begun, possibly eliminating weld or adhesion problems. Exotic alloys will be evaluated for composition prior to being placed in service where lives depend on them. And in the less glamorous applications, such as bolts and fasteners, substandard products and counterfeit items will be evaluated at the receiving function and never allowed to enter the operation