NASA NTRS · 20060038337
Decay Method for Measuring Complex Dielectric Constants During Microwave Processing
Abstract
We have developed a fast in-situ method for measuring the quality factor, Q, and resonant frequency, fr, for an isolated microwave resonant mode. The mode resonant frequency was continuously monitored using a phase modulation frequency tracking technique.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Iny, O., Barmatz, M.. 1994-04-01. Decay Method for Measuring Complex Dielectric Constants During Microwave Processing. https://ntrs.nasa.gov/citations/20060038337
Cite the original work for its findings. Save a collection to share your selection of sources.