NASA NTRS · 20060036986
Review and Document Reliability Issues With Hybrid Microcircuits
Abstract
Reliability issues and lessons learned are described for hybrid microcircuits (including multi-chip modules) used for space applications.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Report, R. E. Gauldin Interim Status, Cuddihy, E. F.. 1995-04-01. Review and Document Reliability Issues With Hybrid Microcircuits. https://ntrs.nasa.gov/citations/20060036986
Cite the original work for its findings. Save a collection to share your selection of sources.