NASA NTRS · 20060035372
Radiation Effects in Advanced Microelectonic Technologies
Abstract
Several new radiation phenomena have been observed in laboratory testing of advanced microelectonics that are not yet of sufficient importance for typical space applications, but provide insight into the likely effects of scaling and device design on radiation hardness.
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Johnston, A. H.. 1997-09-15. Radiation Effects in Advanced Microelectonic Technologies. https://ntrs.nasa.gov/citations/20060035372
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