Minimum Arc Threshold Voltage Experiments on Extravehicular Mobility Unit Samples

Abstract

The International Space Station (ISS) is now under construction in Low Earth Orbit (LEO). The process of building the ISS requires that astronauts carry out many Extravehicular Activities. To protect the astronauts form the hazardous space environment, they are required to wear a suit known as the Extravehicular Mobility Unit (EMU). For most Extra-Vehicular Activities (EVAs) the EMU is tethered to ISS via a steel safety tether. During the course of an EVA it is common for the safety tether to contact exposed metal on both the ISS and the EMU. In this case, the single point ground of the EMU would be at the same potential as the ISS with respect to the LEO Plasma. In the event that the metal structure of the ISS begins to charge negative of the plasma potential as a result of electron collection by the ISS photovoltaic arrays, then the EMU would also be driven to a negative potential. Anodized aluminum components on the EMU would then begin to develop a charge across their amortization layer as ions from the plasma are collected. In the case where large negative potentials are applied to the EMU, dielectric breakdown may occur as a large voltage difference is developed across the thin amortization layer (oxide). The resulting arc plasma may in turn couple to the charge accumulated on the nearby ISS anodized debris shields and thereby generate a large current flow through the metal EMU structure. Current flow through the EMU could result in an electrocution hazard for the Crew Member inside the EMU - and therefore represents an important safety concern. To address this concern, a series of experiments have been undertaken. In each experiment specially prepared anodized aluminum samples were placed in a LEO representative plasma and charged until dielectric breakdown occurred in the form of an arc. This process was repeated a number of times for three sets of samples. During each test the arc voltage and current were monitored. A statistical treatment of the arc voltage threshold will be presented. In addition, safe operating voltages for the EMU are suggested.