High Resolution X-Ray Spectroscopy Using Microcalorimeters

Abstract

During the past 13 years high resolution X ray spectrometers have been developed that use cryogenically cooled microcalorimeters. These devices have inherently high signal-to-noise by operating at temperatures below 0.1 K and can achieve an energy resolution of < 10 eV over the 0.1-10 keV band. Existing devices use doped semiconductor thermometers and typically employ HgTe absorbers. The energy resolution depends on achieving a low heat capacity for the device. For soft X ray applications a relatively thin absorber (approximately 1 micrometer) may be used and an energy resolution of approximately 7 eV has been achieved. For applications up to approximately 10 keV an absorber thickness of approximately 10 micrometer is required and the energy resolution is typically approximately 12 eV. Improvements to the energy resolution in this energy band could be achieved if the problems of thermalizing X rays in low heat capacity superconductors can be overcome. The recent work on transition edge thermometers by Irwin et nl. looks particularly promising because of the higher sensitivity achievable from a sharp superconducting transition. The relatively low impedance of such a device permits the use of a low noise SQUID amplifier for readout. This would also significantly reduce the cryogen heat load compared with JFETs required by higher impedance semiconductor thermometers.