Improved Bakeout Chambers Within Vacuum Chambers

Abstract

Improved bakeout chamber incorporates hardware features that, in conjunction with improved bakeout procedure, reduce spurious contamination and increase accuracy of contamination measurements. When operated according to revised bakeout procedure, they yield measurements of contamination on vacuum-bake test articles more accurate than available previously, and potential for post-bake recontamination of vacuum-baked articles reduced. These chambers improved versions of one described in "Bakeout Chamber Within Vacuum Chamber" (NPO-18959). By enclosing test article in enclave and keeping walls of enclave hotter than test article during bakeout, one prevents condensation of contaminants on inner walls of enclave.