Using expert systems to analyze ATE data

Abstract

The proliferation of automatic test equipment (ATE) is resulting in the generation of large amounts of component data. Some of this component data is not accurate due to the presence of noise. Analyzing this data requires the use of new techniques. This paper describes the process of developing an expert system to analyze ATE data and provides an example rule in the CLIPS language for analyzing trip thresholds for high gain/high speed comparators.