NASA NTRS · 19940000246
Making A D-Latch Sensitive To Alpha Particles
Abstract
Standard complementary metal oxide/semiconductor (CMOS) D-latch integrated circuit modified to increase susceptibility to single-event upsets (SEU's) (changes in logic state) caused by impacts of energetic alpha particles. Suitable for use in relatively inexpensive bench-scale SEU tests of itself and of related integrated circuits like static random-access memories.
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Buehler, Martin G., Blaes, Brent R., Nixon, Robert H.. 1994-05-01. Making A D-Latch Sensitive To Alpha Particles. https://ntrs.nasa.gov/citations/19940000246
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