Optimal experiment design for on-orbit identification

Abstract

An optimal on-orbit experiment is designed to extract the most information from an on-orbit test, subject to the constraints of the testing environment. However, simply jumping in and optimizing standard measures of information with respect to the experiment design can cause severe problems if attention is not paid to the specific needs and properties of the problem at hand. The actual criteria to be optimized depends on (among other things) the particular ID algorithm and parametrization being used. Two parametric techniques are the focus of this presentation: recursive prediction error method (RPEM) and maximum likelihood estimation (MLE).