NASA NTRS · 19930011321
NiCd cell reliability in the mission environment
Abstract
This paper summarizes an effort by Gates Aerospace Batteries (GAB) and the Reliability Analysis Center (RAC) to analyze survivability data for both General Electric and GAB NiCd cells utilized in various spacecraft. For simplicity sake, all mission environments are described as either low Earth orbital (LEO) or geosynchronous Earth orbit (GEO). 'Extreme value statistical methods' are applied to this database because of the longevity of the numerous missions while encountering relatively few failures. Every attempt was made to include all known instances of cell-induced-failures of the battery and to exclude battery-induced-failures of the cell. While this distinction may be somewhat limited due to availability of in-flight data, we have accepted the learned opinion of the specific customer contacts to ensure integrity of the common databases. This paper advances the preliminary analysis reported upon at the 1991 NASA Battery Workshop. That prior analysis was concerned with an estimated 278 million cell-hours of operation encompassing 183 satellites. The paper also cited 'no reported failures to date.' This analysis reports on 428 million cell hours of operation emcompassing 212 satellites. This analysis also reports on seven 'cell-induced-failures.'
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Denson, William K., Klein, Glenn C.. 1993-02-01. NiCd cell reliability in the mission environment. https://ntrs.nasa.gov/citations/19930011321
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