NASA NTRS · 19930000199
Indirect Calibration In Electron-Probe Microanalysis
Abstract
Technique for indirect calibration in electron-probe microanalysis reduces number of measurements needed without significantly degrading precision of measurement data. Advantageous when many analyses must be performed; for example, determining varying chemical composition at many positions across specimen of multicomponent alloy. Time spent acquiring data reduced considerably.
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Terepka, F. M., Vijaykumar, M., Tewari, S. N.. 1992-04-01. Indirect Calibration In Electron-Probe Microanalysis. https://ntrs.nasa.gov/citations/19930000199
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