NASA NTRS · 19920059666
Backscattering from a randomly rough dielectric surface
Abstract
A backscattering model for scattering from a randomly rough dielectric surface is developed based on an approximate solution of a pair of integral equations for the tangential surface fields. Both like and cross-polarized scattering coefficients are obtained. It is found that the like polarized scattering coefficients contain two types of terms: single scattering terms and multiple scattering terms. The single scattering terms in like polarized scattering are shown to reduce the first-order solutions derived from the small perturbation method when the roughness parameters satisfy the slightly rough conditions. When surface roughnesses are large but the surface slope is small, only a single scattering term corresponding to the standard Kirchhoff model is significant. If the surface slope is large, the multiple scattering term will also be significant. The cross-polarized backscattering coefficients satisfy reciprocity and contain only multiple scattering terms. The difference between vertical and horizontal scattering coefficients is found to increase with the dielectric constant and is generally smaller than that predicted by the first-order small perturbation model. Good agreements are obtained between this model and measurements from statistically known surfaces.
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Fung, Adrian K., Li, Zongqian, Chen, K. S.. 1992-03-01. Backscattering from a randomly rough dielectric surface. https://ntrs.nasa.gov/citations/19920059666
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