NASA NTRS · 19910061368
Radiation damage in a Tektronix 512 CCD
Abstract
A Tektronix CCD was subjected to a proton beam. Comparisons were made of the CCD characteristics before, during, and after radiation. Gain and readout noise were not affected and charge transfer efficiency, full well, and dark current were. Permanent CTE damage resulted immediately upon radiation, but full well damage developed two days after radiation, while the dark current showed signs of recovery before permanent damage occurred. Histogram analysis showed that the most spiky-type behavior resulted from damage to defects existing in the CCD before radiation.
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Brown, Larry W., Rebar, Francis, Fowler, Walter, Yagelowich, John, Ziegler, Michael. 1990-01-01. Radiation damage in a Tektronix 512 CCD. https://ntrs.nasa.gov/citations/19910061368
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