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NASA NTRS · 19910015006

Two-dimensional high temperature strain measurement system

Abstract

Two-dimensional optical strain measurements on high temperature test specimens are presented. This two-dimensional capability is implemented through a rotatable sensitive strain axis. Three components of surface strain can be measured automatically, from which the first and second principal strains are calculated. One- and two-dimensional strain measurements at temperatures beyond 750 C with a resolution of 15 microstrain are demonstrated. The system is based on a one-dimensional speckle shift technique. The speckle shift technique makes use of the linear relationship between surface strain and the differential shift of laser speckle patterns in the diffraction plane. Laser speckle is a phase effect that occurs when spatially coherent light interacts with an optically rough surface. Since speckle is generated by any diffusely reflecting surface, no specimen preparation is needed to obtain a good signal. Testing was done at room temperature on a flat specimen of Inconel 600 mounted in a fatigue testing machine. A load cell measured the stress on the specimen before and after acquiring the speckle data. Strain components were measured at 0 C (parallel to the load axis) and at plus or minus 45 C, and plots indicate the calculated values of the first and second principal strains. The measured values of Young's modulus and Poisson's ratio are in good agreement with handbook values. Good linearity of the principal strain moduli at high temperatures indicate precision and stability of the system. However, a systematic error in the high-temperature test setup introduced a scale factor in the slopes of the two-dimensional stress-strain curves. No high temperature effects, however, have been observed to degrade speckle correlation.

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BibTeXRIS

Lant, Christian T., Barranger, John P.. 1989-04-01. Two-dimensional high temperature strain measurement system. https://ntrs.nasa.gov/citations/19910015006

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