Two-Wavelength Optical-Path-Difference Mapping

Abstract

Proposed technique for measuring shapes and alignments of reflectors based on use of two-wavelength absolute-distance interferometer to generate optical-path-difference maps of reflecting or refracting surfaces. Facilitates such tasks as determining manufacturing and alignment errors of off-axis segment of large-aperture paraboloidal telescope mirror, or aligning all segments of such mirror. Suitable for use where reflecting surfaces highly aspherical, initial misalignments large, and/or surface errors exceed optical wavelengths.