NASA NTRS · 19900000148
Thermal-Interaction Matrix For Resistive Test Structure
Abstract
Linear mathematical model predicts increase in temperature in each segment of 15-segment resistive structure used to test electromigration. Assumption of linearity based on fact: equations that govern flow of heat are linear and coefficients in equations (heat conductivities and capacities) depend only weakly on temperature and considered constant over limited range of temperature.
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Buehler, Martin G., Dhiman, Jaipal K., Zamani, Nasser. 1990-04-01. Thermal-Interaction Matrix For Resistive Test Structure. https://ntrs.nasa.gov/citations/19900000148
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