NASA NTRS · 19890038293
Techniques for analyzing frequency selective surfaces - A review
Abstract
A number of representative techniques for analyzing frequency-selective surfaces (FSSs), which comprise periodic arrays of patches or apertures in a conducting screen and find important applications as filters in microwaves and optics, are discussed. The basic properties of the FSSs are reviewed and several different approaches to predicting their frequency-response characteristics are described. Some recent developments in the treatment of truncated, curved, and doubly periodic screens are mentioned and representative experimental results are included.
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Mittra, Raj, Chan, Chi H., Cwik, Tom. 1988-12-01. Techniques for analyzing frequency selective surfaces - A review. https://ntrs.nasa.gov/citations/19890038293
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