Spectrograph Measures Contamination Of Optical Elements

Abstract

Scanning-monochromator spectrograph designed to measure contamination on surfaces of optical elements as function of time. Repeatedly exposes samples to environment, then measures their transmittances or reflectances over range of wavelengths. Intended for use at vacuum-ultraviolet wavelengths to evaluate effects of outgassing, heating, and cooling on optical instruments. Principle of operation also applicable to spectral monitoring of time-dependent contamination at other wavelengths and in laboratory, industrial, or other settings.