Engineering Papers⌕ Search

NASA NTRS · 19880014498

Improved processing of Si3N4

Abstract

A sintered Si3N4-SiO2-Y2O3 composition, NASA 6Y, was developed that reached four-point flexural average strength/standard deviation values of 857/36, 544/33, and 462/59 MPa at room temperature, 1200, and 1370 C, respectively. These strengths represented improvements of 56, 38, and 21 percent over baseline properties at the three test temperatures. At room temperature the standard deviation was reduced by more than a factor of three. These accomplishments were realized by the iterative utilization of conventional X-radiography to characterize structural (density) uniformity as affected by systematic changes in powder processing and sintering parameters. Accompanying the improvement in mechanical properties was a change in the type of flaw causing failure from a pore to a large columnar beta-Si3N4 grain typically 40 to 80 microns, 10 to 30 microns wide, and with an aspect ratio of 5:1.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Sanders, William A., Baaklini, George Y.. 1986-05-01. Improved processing of Si3N4. https://ntrs.nasa.gov/citations/19880014498

Cite the original work for its findings. Save a collection to share your selection of sources.