NASA NTRS · 19880000522
Mounting Thin Samples For Electrical Measurements
Abstract
New method for mounting thin sample for electrical measurements involves use of vacuum chuck to hold a ceramic mounting plate, which holds sample. Contacts on mounting plate establish electrical connection to sample. Used to make electrical measurements over temperature range from 77 to 1,000 K and does not introduce distortions into magnetic field during Hall measurements.
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Matus, L. G., Summers, R. L.. 1988-11-01. Mounting Thin Samples For Electrical Measurements. https://ntrs.nasa.gov/citations/19880000522
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