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NASA NTRS ยท 19870017774

Surface inspection: Research and development

Abstract

Surface inspection techniques are used for process learning, quality verification, and postmortem analysis in manufacturing for a spectrum of disciplines. First, trends in surface analysis are summarized for integrated circuits, high density interconnection boards, and magnetic disks, emphasizing on-line applications as opposed to off-line or development techniques. Then, a closer look is taken at microcontamination detection from both a patterned defect and a particulate inspection point of view.

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Batchelder, J. S.. 1987-08-01. Surface inspection: Research and development. https://ntrs.nasa.gov/citations/19870017774

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