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NASA NTRS ยท 19870017771

Electronics reliability and measurement technology

Abstract

A summary is presented of the Electronics Reliability and Measurement Technology Workshop. The meeting examined the U.S. electronics industry with particular focus on reliability and state-of-the-art technology. A general consensus of the approximately 75 attendees was that "the U.S. electronics industries are facing a crisis that may threaten their existence". The workshop had specific objectives to discuss mechanisms to improve areas such as reliability, yield, and performance while reducing failure rates, delivery times, and cost. The findings of the workshop addressed various aspects of the industry from wafers to parts to assemblies. Key problem areas that were singled out for attention are identified, and action items necessary to accomplish their resolution are recommended.

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BibTeXRIS

Heyman, Joseph S.. 1987-08-01. Electronics reliability and measurement technology. https://ntrs.nasa.gov/citations/19870017771

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