NASA NTRS · 19860025310
Shear-strain contours from moire interferometry
Abstract
The development of whole-field contour maps of shear strains gamma (xy), derived from displacement fields obtained by moire interferometry with 2400 lines/mm, is described. The use of mechanical differentiation to obtain cross-derivatives of displacements and the use of graphical additive moire to sum the cross-derivatives are explained. Quantitative analysis in the small-strain domain is possible because of the high sensitivity of moire interferometry. The applicability of this technique is shown by the testing of a short epoxy beam under three-point bending.
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Post, D., Czarnek, R., Joh, D.. 1985-09-01. Shear-strain contours from moire interferometry. https://ntrs.nasa.gov/citations/19860025310
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