NASA NTRS · 19860000208
Guidelines for SEU-Resistant Integrated Circuits
Abstract
Paper presents recent results of continuing program for increasing resistance of integrated circuits to single-event upset (SEU). Results based on study of test data for heavy-ion SEU in more than 180 different types of devices. (Some devices perform identical functions but made by different processes.) Program also examines developments in mathematical models for SEU.
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Nichols, D. K.. 1986-05-01. Guidelines for SEU-Resistant Integrated Circuits. https://ntrs.nasa.gov/citations/19860000208
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