NASA NTRS · 19840025960
Development of metallization process
Abstract
Pastes are evaluated that contain additives to aid in the silicon to metallization contact. None are completely successful. Pastes are evaluated using a heated stage scanning electron microscope (SEM). This equipment shows promise for future evaluations.
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Garcia, A., III. 1984-07-01. Development of metallization process. https://ntrs.nasa.gov/citations/19840025960
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