NASA NTRS · 19830000504
Finding Open Faults In CMOS Circuits
Abstract
Algorithm specifies sequence of input test signals and interpretation of resulting output signals for identifying stuck-open faults in complementary metal-oxide semiconductor (CMOS) integrated logic circuits. Incorporated in software for online production testing of CMOS circuits.
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Chandramouli, R.. 1984-11-01. Finding Open Faults In CMOS Circuits. https://ntrs.nasa.gov/citations/19830000504
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