NASA NTRS · 19800000030
JANTX2N4856 field-effect transistor
Abstract
Report evaluates effects of power and temperature overstress on Teledyne and Texas Instruments devices. Temperature stress caused most failures for both manufacturers' lots. Failure modes are analyzed.
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1980-08-01. JANTX2N4856 field-effect transistor. https://ntrs.nasa.gov/citations/19800000030
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