NASA NTRS · 19800000025
JANTX2N2920 Dual transistor
Abstract
Report describes effects of power and temperature overstress on Fairchild and National Semiconductor devices. 160 hour temperature stress was only test to cause notable damage. Loss of gain is principal failure mode.
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1980-08-01. JANTX2N2920 Dual transistor. https://ntrs.nasa.gov/citations/19800000025
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