NASA NTRS · 19800000019
JANTX2N2219A dual transistor
Abstract
Report describes effects of power and temperature overstress on Texas Instruments and National Semiconductor devices. Texas Instruments devices had only two failures in 2500 hours of testing. National Semiconductor devices reached 50% failure limit. No consistent failure mode was detected.
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1980-08-01. JANTX2N2219A dual transistor. https://ntrs.nasa.gov/citations/19800000019
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