Programs for calculating cell parameters in electron and X-ray diffraction

Abstract

Ten programs for calculating cell parameters from single crystal electron diffraction patterns are presented. Most of the programs, written for use with a programmable desk calculator, are also applicable to X-ray diffraction work. The programs can be used to calculate d-spacings from electron diffraction plate measurements, and to determine cell data (including interplanar angles and zone angles) for all crystal systems. A program for rhombohedral-hexagonal conversions and one for matching crystal data from standards with apparent crystal parameters found in diffraction patterns are included. Because they allow rapid determination of data not present in X-ray listings or elsewhere in the literature, the programs facilitate identification of unknowns.