NASA NTRS · 19790010042
Diode step stress program for JANTX1N746A
Abstract
The effect was studied of power/temperature step stress when applied to the diode JANTX1N746A manufactured by Siemens and Motorola. Test results and failure analyses are included.
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1979-01-01. Diode step stress program for JANTX1N746A. https://ntrs.nasa.gov/citations/19790010042
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