NASA NTRS · 19790010039
Diode step stress program for JANTX1N5415
Abstract
Diode JANTX1N5415 was tested to evaluate the reliability of these devices from different manufacturers, and to gain more knowledge of stress testing. The tests for determining power/temperature step stresses are described, and the test results are discussed. Failure analyses for power stress, and temperature stress are presented.
Keep this discovery
Explore connections, maps & timelines
1979-01-01. Diode step stress program for JANTX1N5415. https://ntrs.nasa.gov/citations/19790010039
Cite the original work for its findings. Save a collection to share your selection of sources.