NASA NTRS · 19790009080
Diode step stress program, JANTX1N981B
Abstract
Power/temperature step stress was applied to the Zener diode JANTX1N981B. Reliability of the device was determined. Control units were maintained for verification of the electrical parametric testing. Results are reported.
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1978-12-01. Diode step stress program, JANTX1N981B. https://ntrs.nasa.gov/citations/19790009080
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